½ÃÀ庸°í¼­
»óǰÄÚµå
1596382

¼¼°èÀÇ ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå : À¯Çüº°, Á¦Ç°º°, ºÎǰº°, ¿ëµµº° - ¿¹Ãø(2025-2030³â)

Semiconductor Automated Test Equipment Market by Type (Discrete ATE, Memory ATE), Product (Interconnection & Verification Testing, Logic Testing, Printed Circuit Board Testing), Component, Application - Global Forecast 2025-2030

¹ßÇàÀÏ: | ¸®¼­Ä¡»ç: 360iResearch | ÆäÀÌÁö Á¤º¸: ¿µ¹® 183 Pages | ¹è¼Û¾È³» : 1-2ÀÏ (¿µ¾÷ÀÏ ±âÁØ)

    
    
    




¡á º¸°í¼­¿¡ µû¶ó ÃֽŠÁ¤º¸·Î ¾÷µ¥ÀÌÆ®ÇÏ¿© º¸³»µå¸³´Ï´Ù. ¹è¼ÛÀÏÁ¤Àº ¹®ÀÇÇØ Áֽñ⠹ٶø´Ï´Ù.

¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀÇ 2023³â ½ÃÀå ±Ô¸ð´Â 80¾ï ´Þ·¯·Î Æò°¡µÇ¾ú°í, 2024³â¿¡´Â 84¾ï 2,000¸¸ ´Þ·¯·Î ÃßÁ¤µÇ¸ç, CAGR 5.32%·Î ¼ºÀåÇÒ Àü¸ÁÀ̰í, 2030³â¿¡´Â 115¾ï 1,000¸¸ ´Þ·¯¿¡ µµ´ÞÇÒ °ÍÀ¸·Î ¿¹ÃøµË´Ï´Ù.

¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡(ATE) ½ÃÀå¿¡´Â ±â´É, ¼º´É ¹× ¼³°è ¿ä±¸ »çÇ×À» ÁؼöÇϱâ À§ÇØ ¹ÝµµÃ¼¸¦ Å×½ºÆ®ÇÏ´Â µ¥ »ç¿ëµÇ´Â ½Ã½ºÅÛÀÌ Æ÷ÇԵǾî ÀÖ½À´Ï´Ù. ÀÌ ÀåÄ¡´Â ºÒ·®Ç°À» ÃÖ¼ÒÈ­ÇÏ°í ½Å·Ú¼º È®º¸¿¡ ÁßÁ¡À» µÐ ¹ÝµµÃ¼ Á¦Á¶ÀÇ Ç°Áú º¸Áõ¿¡ ÇʼöÀûÀÔ´Ï´Ù. ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ÀÇ ¿ëµµ´Â, °¡Àü, ÀÚµ¿Â÷, Åë½Å, »ê¾÷ µî Æø³ÐÀº ºÐ¾ß¿¡ ¹ÌÄ¡°í ÀÖ½À´Ï´Ù. ¹ÝµµÃ¼ ¸ÞÀÌÄ¿, ÆÕ¸®½º ±â¾÷, ÁýÀû µð¹ÙÀ̽º ¸ÞÀÌÄ¿(IDM) µî, ÃÖÁ¾ ¿ëµµ´Â ´Ù¹æ¸é¿¡ °ÉÃÄ, °¢°¢ÀÌ ÀÚ»ç Á¦Ç°ÀÇ È¿À²°ú ½Å·Ú¼ºÀ» ³ôÀÌ·Á°í Çϰí ÀÖ½À´Ï´Ù.

ÁÖ¿ä ½ÃÀå Åë°è
±âÁسâ(2023³â) 80¾ï ´Þ·¯
¿¹Ãø³â(2024³â) 84¾ï 2,000¸¸ ´Þ·¯
¿¹Ãø³â(2030³â) 115¾ï 1,000¸¸ ´Þ·¯
CAGR(%) 5.32%

½ÃÀå ¼ºÀå ¿äÀÎÀ¸·Î´Â °¡Àü ¼ö¿ä Áõ°¡, 5G¿Í °°Àº ¹«¼± ±â¼úÀÇ ¹ßÀü, ¹ÝµµÃ¼ µð¹ÙÀ̽ºÀÇ º¹ÀâÈ­ µîÀÌ ÀÖ¾î °ß°íÇÑ Å×½ºÆ® ¼Ö·ç¼ÇÀÇ Çʿ伺À» ºÎÃß±â°í ÀÖ½À´Ï´Ù. ÀΰøÁö´É°ú ¸Ó½Å·¯´×À» ÅëÇÕÇϰí, ¿¹Áöº¸Àü°ú ÀûÀÀ Å×½ºÆ®°¡ °¡´ÉÇÑ Â÷¼¼´ë ATE ½Ã½ºÅÛÀ» ±¸ÃàÇÔÀ¸·Î½á ÃֽŠºñÁî´Ï½º ±âȸ°¡ ³Ð¾îÁö°í ÀÖ½À´Ï´Ù. ±â¾÷Àº AI¸¦ °­È­ÇÑ ATE ½Ã½ºÅÛ¿¡ ÅõÀÚÇϰí IoT µð¹ÙÀ̽ºÀÇ ±Þ°ÝÇÑ Áõ°¡·Î º¸´Ù Á¤±³ÇÑ Å×½ºÆ® ¹æ¹ýÀ» ÇÊ¿ä·Î ÇÏ´Â ¾÷°è¿Í Çù·ÂÇÔÀ¸·Î½á ÀÌ·¯ÇÑ ±âȸ¸¦ Ȱ¿ëÇÒ ¼ö ÀÖ½À´Ï´Ù. ±×·¯³ª ¼³ºñ ºñ¿ëÀÇ ³ôÀÌ, ±â¼úÀûÀÎ º¹À⼺, ²÷ÀÓ¾ø´Â ±â¼ú Çõ½Å µîÀÇ °úÁ¦°¡ Å« À庮ÀÌ µÇ°í ÀÖ½À´Ï´Ù. Çõ½ÅÀº Å×½ºÆ® ´ç ºñ¿ëÀ» ÁÙÀÌ°í ´Ù¾çÇÑ ¹ÝµµÃ¼ À¯Çü¿¡ ´ëÀÀÇÏ´Â ½Ã½ºÅÛÀÇ À¯¿¬¼ºÀ» °­È­ÇÏ´Â µ¥ ÁßÁ¡À» µÎ¾î¾ß ÇÕ´Ï´Ù. ¸ðµâ½Ä µðÀÚÀÎÀÇ ATE ½Ã½ºÅÛÀ» °³¹ßÇÏ¸é »ç¿ëÀÚ Á¤ÀÇ ¹× È®À强 ¿ä±¸¿¡ ´ëÀÀÇÒ ¼ö ÀÖ½À´Ï´Ù. ¶ÇÇÑ ½ÃÀåÀÇ Æ¯¼ºÀº ¿ªµ¿ÀûÀÌ°í ¼Óµµ°¡ ºü¸£¸ç Áö¼ÓÀûÀÎ ¿¬±¸°³¹ß ÅõÀÚ°¡ Áß¿äÇÕ´Ï´Ù.

ºñÁî´Ï½º ¼ºÀåÀ» À§Çؼ­´Â Çõ½ÅÀ» ÃËÁøÇϱâ À§ÇÑ °øµ¿ ¿¬±¸ ÀÌ´Ï¼ÅÆ¼ºê¿Í ÆÄÆ®³Ê½Ê¿¡ ÁÖ·ÂÇØ¾ß ÇÕ´Ï´Ù. ½Ã½ºÅÛ ÅëÇÕ ´É·ÂÀÇ °ÝÂ÷¸¦ ¸Þ¿ì°í Å×½ºÆ® È¿À²¼ºÀ» ³ôÀÓÀ¸·Î½á ±Þ¼ÓÇÑ ¼ö¿ä º¯È­¿Í ±â¼ú Ç¥ÁØÀÇ ÁøÈ­¿¡ ´ëÀÀÇÒ ¼ö ÀÖ½À´Ï´Ù. ¶ÇÇÑ È¯°æ ģȭÀûÀÌ°í ¿¡³ÊÁö È¿À²ÀûÀÎ ½Ã½ºÅÛÀ» Áß½ÃÇÔÀ¸·Î½á ¼¼°èÀÇ Áö¼Ó°¡´É¼º µ¿Çâ¿¡ ºÎÇÕÇÏ¿© ´õ ¸¹Àº ÀÌÇØ °ü°èÀÚ¸¦ ²ø¾îµéÀÏ ¼ö ÀÖ´Ù°í »ý°¢µË´Ï´Ù.

½ÃÀå ¿ªÇÐ : ±Þ¼ÓÈ÷ ÁøÈ­ÇÏ´Â ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀÇ ÁÖ¿ä ½ÃÀå ÀλçÀÌÆ® °ø°³

¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀº ¼ö¿ä ¹× °ø±ÞÀÇ ¿ªµ¿Àû ÀÎ »óÈ£ ÀÛ¿ëÀ» ÅëÇØ º¯¸ð¸¦ °Þ°í ÀÖ½À´Ï´Ù. ÀÌ·¯ÇÑ ½ÃÀå ¿ªÇÐÀÇ ÁøÈ­¸¦ ÀÌÇØÇÔÀ¸·Î½á ±â¾÷Àº ÃæºÐÇÑ Á¤º¸¸¦ ¹ÙÅÁÀ¸·Î ÅõÀÚ°áÁ¤, Àü·«Àû ÀÇ»ç°áÁ¤, »õ·Î¿î ºñÁî´Ï½º ±âȸ¸¦ ȹµæÇÒ ¼ö ÀÖ½À´Ï´Ù. ÀÌ·¯ÇÑ µ¿ÇâÀ» Á¾ÇÕÀûÀ¸·Î ÆÄ¾ÇÇÔÀ¸·Î½á ±â¾÷Àº Á¤Ä¡Àû, Áö¸®Àû, ±â¼úÀû, »çȸÀû, °æÁ¦Àû ¿µ¿ª¿¡ °ÉÄ£ ´Ù¾çÇÑ ¸®½ºÅ©¸¦ °æ°¨ÇÒ ¼ö ÀÖÀ» »Ó¸¸ ¾Æ´Ï¶ó, ¼ÒºñÀÚ Çൿ°ú ±×°ÍÀÌ Á¦Á¶ ºñ¿ë ¶Ç´Â ±¸¸Å µ¿Çâ¿¡ ¹ÌÄ¡´Â ¿µÇâÀ» º¸´Ù ¸íÈ®ÇÏ°Ô ÀÌÇØÇÒ ¼ö ÀÖ½À´Ï´Ù.

  • ½ÃÀå ¼ºÀå ÃËÁø¿äÀÎ
    • OEM¿¡ ÀÇÇÑ °íµµÀÇ ÀÚµ¿ Å×½ºÆ® ¹æ¹ý Áß½Ã
    • ÀÚµ¿Â÷ ¹× Ç×°ø ºÐ¾ß¿¡¼­ ¼±Áø ½Ã½ºÅÛ ÅëÇÕÀÇ È®´ë
    • ¼ÒºñÀÚ ÀÏ·ºÆ®·Î´Ð½ºÀÇ ±ÞÁõ
  • ½ÃÀå ¼ºÀå ¾ïÁ¦¿äÀÎ
    • Å×½ºÆ® ÀåÄ¡ÀÇ °íºñ¿ë
  • ½ÃÀå ±âȸ
    • Â÷¼¼´ë SoC Å×½ºÅÍ¿Í ATEÀÇ ±Ù´ëÈ­
    • ÀÚÀ²ÁÖÇàÂ÷³ª ¹«ÀοîÀüÂ÷ÀÇ Å×½ºÆ®¿¡ ´ëÇÑ ÀáÀçÀû ¿ä°Ç
  • ½ÃÀåÀÇ °úÁ¦
    • ¹ÝµµÃ¼ ATE¿¡ °üÇÑ ±â¼úÀû °úÁ¦
    • ÀÎ½Ä ºÎÁ·°ú ±â¼ú ¼÷·ÃÀÚÀÇ ºÎÁ·

Porter's Five Forces : ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀ» Ž»öÇÏ´Â Àü·« µµ±¸

Porter's Five Forces ÇÁ·¹ÀÓ ¿öÅ©´Â ½ÃÀå »óȲÀÇ °æÀï ±¸µµ¸¦ ÀÌÇØÇÏ´Â Áß¿äÇÑ µµ±¸ÀÔ´Ï´Ù. Porter's Five Forces ÇÁ·¹ÀÓ ¿öÅ©´Â ±â¾÷ÀÇ °æÀï·ÂÀ» Æò°¡Çϰí Àü·«Àû ±âȸ¸¦ ޱ¸ÇÏ´Â ¸íÈ®ÇÑ ±â¼úÀ» Á¦°øÇÕ´Ï´Ù. ÀÌ ÇÁ·¹ÀÓ ¿öÅ©´Â ±â¾÷ÀÌ ½ÃÀå ³» ¼¼·Âµµ¸¦ Æò°¡ÇÏ°í ½Å±Ô »ç¾÷ÀÇ ¼öÀͼºÀ» °áÁ¤ÇÏ´Â µ¥ µµ¿òÀÌ µË´Ï´Ù. ÀÌ·¯ÇÑ ÀλçÀÌÆ®¸¦ ÅëÇØ ±â¾÷Àº ÀÚ»çÀÇ °­Á¡À» Ȱ¿ëÇϰí, ¾àÁ¡À» ÇØ°áÇϰí, ÀáÀçÀûÀÎ °úÁ¦¸¦ ÇÇÇÒ ¼ö ÀÖÀ¸¸ç, º¸´Ù °­ÀÎÇÑ ½ÃÀå¿¡¼­ÀÇ Æ÷Áö¼Å´×À» º¸ÀåÇÒ ¼ö ÀÖ½À´Ï´Ù.

PESTLE ºÐ¼® : ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå¿¡¼­ ¿ÜºÎ ¿µÇâ ÆÄ¾Ç

¿ÜºÎ °Å½Ã ȯ°æ ¿äÀÎÀº ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀÇ ¼º°ú ¿ªÇÐÀ» Çü¼ºÇÏ´Â µ¥ ¸Å¿ì Áß¿äÇÑ ¿ªÇÒÀ» ÇÕ´Ï´Ù. Á¤Ä¡Àû, °æÁ¦Àû, »çȸÀû, ±â¼úÀû, ¹ýÀû, ȯ°æÀû ¿äÀÎ ºÐ¼®Àº ÀÌ·¯ÇÑ ¿µÇâÀ» Ž»öÇÏ´Â µ¥ ÇÊ¿äÇÑ Á¤º¸¸¦ Á¦°øÇÕ´Ï´Ù. PESTLE ¿äÀÎÀ» Á¶»çÇÔÀ¸·Î½á ±â¾÷Àº ÀáÀçÀûÀÎ À§Çè°ú ±âȸ¸¦ ´õ Àß ÀÌÇØÇÒ ¼ö ÀÖ½À´Ï´Ù. ÀÌ ºÐ¼®À» ÅëÇØ ±â¾÷Àº ±ÔÁ¦, ¼ÒºñÀÚ ¼±È£, °æÁ¦ µ¿ÇâÀÇ º¯È­¸¦ ¿¹ÃøÇÏ°í ¾ÕÀ¸·Î ¿¹»óµÇ´Â Àû±ØÀûÀÎ ÀÇ»ç °áÁ¤À» ÇÒ Áغñ¸¦ ÇÒ ¼ö ÀÖ½À´Ï´Ù.

½ÃÀå Á¡À¯À² ºÐ¼® : ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå °æÀï ±¸µµ ÆÄ¾Ç

¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀÇ »ó¼¼ÇÑ ½ÃÀå Á¡À¯À² ºÐ¼®À» ÅëÇØ °ø±Þ¾÷üÀÇ ¼º°ú¸¦ Á¾ÇÕÀûÀ¸·Î Æò°¡ÇÒ ¼ö ÀÖ½À´Ï´Ù. ±â¾÷Àº ¼öÀÍ, °í°´ ±â¹Ý, ¼ºÀå·ü µî ÁÖ¿ä ÁöÇ¥¸¦ ºñ±³ÇÏ¿© °æÀï Æ÷Áö¼Å´×À» ¹àÈú ¼ö ÀÖ½À´Ï´Ù. ÀÌ ºÐ¼®À» ÅëÇØ ½ÃÀå ÁýÁß, ´ÜÆíÈ­, ÅëÇÕ µ¿ÇâÀ» ¹àÇô³»°í º¥´õµéÀº °æÀïÀÌ Ä¡¿­ÇØÁö´Â °¡¿îµ¥ ÀÚ»çÀÇ ÁöÀ§¸¦ ³ôÀÌ´Â Àü·«Àû ÀÇ»ç °áÁ¤À» ³»¸®´Â µ¥ ÇÊ¿äÇÑ Áö½ÄÀ» ¾òÀ» ¼ö ÀÖ½À´Ï´Ù.

FPNV Æ÷Áö¼Å´× ¸ÅÆ®¸¯½º : ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå¿¡¼­ °ø±Þ¾÷üÀÇ ¼º´É Æò°¡

FPNV Æ÷Áö¼Å´× ¸ÅÆ®¸¯½º´Â ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå¿¡¼­ º¥´õ¸¦ Æò°¡ÇÏ´Â Áß¿äÇÑ µµ±¸ÀÔ´Ï´Ù. ÀÌ ¸ÅÆ®¸¯½º¸¦ ÅëÇØ ºñÁî´Ï½º Á¶Á÷Àº °ø±Þ¾÷üÀÇ ºñÁî´Ï½º Àü·«°ú Á¦Ç° ¸¸Á·µµ¸¦ ±âÁØÀ¸·Î Æò°¡ÇÏ¿© ¸ñÇ¥¿¡ ¸Â´Â ÃæºÐÇÑ Á¤º¸¸¦ ¹ÙÅÁÀ¸·Î ÀÇ»ç °áÁ¤À» ³»¸± ¼ö ÀÖ½À´Ï´Ù. ³× °¡Áö »çºÐ¸éÀ» ÅëÇØ °ø±Þ¾÷ü¸¦ ¸íÈ®Çϰí Á¤È®ÇÏ°Ô ¼¼ºÐÈ­ÇÏ¿© Àü·« ¸ñÇ¥¿¡ °¡Àå ÀûÇÕÇÑ ÆÄÆ®³Ê ¹× ¼Ö·ç¼ÇÀ» ÆÄ¾ÇÇÒ ¼ö ÀÖ½À´Ï´Ù.

Àü·« ºÐ¼® ¹× Ãßõ : ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå¿¡¼­ ¼º°øÀ» À§ÇÑ ±æÀ» ±×¸®±â

¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀåÀÇ Àü·« ºÐ¼®Àº ¼¼°è ½ÃÀå¿¡¼­ÀÇ ÇÁ·¹Á𽺠°­È­¸¦ ¸ñÇ¥·Î ÇÏ´Â ±â¾÷¿¡ ÇʼöÀûÀÎ ¿ä¼ÒÀÔ´Ï´Ù. ÁÖ¿ä ÀÚ¿ø, ´É·Â, ½ÇÀû ÁöÇ¥¸¦ Àç°ËÅäÇÏ´Â °ÍÀ¸·Î, ±â¾÷Àº ¼ºÀå ±âȸ¸¦ ƯÁ¤ÇØ, °³¼±¿¡ ÀÓÇÒ ¼ö ÀÖ½À´Ï´Ù. ÀÌ Á¢±Ù ¹æ½ÄÀ» ÅëÇØ °æÀï Á¤¼¼ÀÇ °úÁ¦¸¦ ±Øº¹ÇÏ°í »õ·Î¿î ºñÁî´Ï½º ±âȸ¸¦ Ȱ¿ëÇÏ¿© Àå±âÀûÀÎ ¼º°øÀ» °ÅµÎ±â À§ÇÑ Ã¼Á¦¸¦ °®Ãâ ¼ö ÀÖ½À´Ï´Ù.

ÀÌ º¸°í¼­´Â ÁÖ¿ä °ü½É ºÐ¾ß¸¦ Æ÷°ýÇÏ´Â ½ÃÀåÀÇ Á¾ÇÕÀûÀÎ ºÐ¼®À» Á¦°øÇÕ´Ï´Ù.

1. ½ÃÀå ħÅõ : ÇöÀç ½ÃÀå ȯ°æÀÇ »ó¼¼ÇÑ °ËÅä, ÁÖ¿ä ±â¾÷ÀÇ ±¤¹üÀ§ÇÑ µ¥ÀÌÅÍ, ½ÃÀå µµ´Þ¹üÀ§ ¹× Àü¹ÝÀûÀÎ ¿µÇâ·ÂÀ» Æò°¡ÇÕ´Ï´Ù.

2. ½ÃÀå °³Ã´µµ : ½ÅÈï ½ÃÀåÀÇ ¼ºÀå ±âȸ¸¦ ÆÄ¾ÇÇÏ°í ±âÁ¸ ºÐ¾ßÀÇ È®Àå °¡´É¼ºÀ» Æò°¡ÇÏ¸ç ¹Ì·¡ ¼ºÀåÀ» À§ÇÑ Àü·«Àû ·Îµå¸ÊÀ» Á¦°øÇÕ´Ï´Ù.

3. ½ÃÀå ´Ù¾çÈ­ : ÃÖ±Ù Á¦Ç° Ãâ½Ã, ¹Ì°³Ã´ Áö¿ª, ¾÷°èÀÇ ÁÖ¿ä Áøº¸, ½ÃÀåÀ» Çü¼ºÇÏ´Â Àü·«Àû ÅõÀÚ¸¦ ºÐ¼®ÇÕ´Ï´Ù.

4. °æÀï Æò°¡ ¹× Á¤º¸ : °æÀï ±¸µµ¸¦ öÀúÈ÷ ºÐ¼®ÇÏ¿© ½ÃÀå Á¡À¯À², »ç¾÷ Àü·«, Á¦Ç° Æ÷Æ®Æú¸®¿À, ÀÎÁõ, ±ÔÁ¦ ´ç±¹ ½ÂÀÎ, ƯÇã µ¿Çâ, ÁÖ¿ä ±â¾÷ÀÇ ±â¼ú Áøº¸ µîÀ» °ËÁõÇÕ´Ï´Ù.

5. Á¦Ç° °³¹ß ¹× Çõ½Å : ¹Ì·¡ ½ÃÀå ¼ºÀåÀ» °¡¼ÓÇÒ °ÍÀ¸·Î ¿¹»óµÇ´Â ÃÖ÷´Ü ±â¼ú, ¿¬±¸°³¹ß Ȱµ¿, Á¦Ç° Çõ½ÅÀ» °­Á¶ÇÕ´Ï´Ù.

¶ÇÇÑ ÀÌÇØ°ü°èÀÚ°¡ ÃæºÐÇÑ Á¤º¸¸¦ ¾ò°í ÀÇ»ç°áÁ¤À» ÇÒ ¼ö ÀÖµµ·Ï Áß¿äÇÑ Áú¹®¿¡ ´ë´äÇϰí ÀÖ½À´Ï´Ù.

1. ÇöÀç ½ÃÀå ±Ô¸ð ¹× ÇâÈÄ ¼ºÀå ¿¹ÃøÀº?

2. ÃÖ°íÀÇ ÅõÀÚ ±âȸ¸¦ Á¦°øÇÏ´Â Á¦Ç°, ºÎ¹® ¹× Áö¿ªÀº ¾îµðÀԴϱî?

3. ½ÃÀåÀ» Çü¼ºÇÏ´Â ÁÖ¿ä ±â¼ú µ¿Çâ ¹× ±ÔÁ¦ÀÇ ¿µÇâÀº?

4. ÁÖ¿ä º¥´õÀÇ ½ÃÀå Á¡À¯À² ¹× °æÀï Æ÷Áö¼ÇÀº?

5. º¥´õ ½ÃÀå ÁøÀÔ ¹× ö¼ö Àü·«ÀÇ ¿øµ¿·ÂÀÌ µÇ´Â ¼öÀÍ¿ø°ú Àü·«Àû ±âȸ´Â ¹«¾ùÀΰ¡?

¸ñÂ÷

Á¦1Àå ¼­¹®

Á¦2Àå Á¶»ç ¹æ¹ý

Á¦3Àå ÁÖ¿ä ¿ä¾à

Á¦4Àå ½ÃÀå °³¿ä

Á¦5Àå ½ÃÀå ÀλçÀÌÆ®

  • ½ÃÀå ¿ªÇÐ
    • ¼ºÀå ÃËÁø¿äÀÎ
      • OEMÀº °íµµÀÇ ÀÚµ¿ Å×½ºÆ® ¹æ¹ý¿¡ ÁÖ¸ñ
      • ÀÚµ¿Â÷ ¹× Ç×°øÀÇ Ã·´Ü ½Ã½ºÅÛ ÅëÇÕ ÁøÇà
      • °¡ÀüÁ¦Ç°ÀÇ ´ëÆøÀûÀÎ Áõ°¡
    • ¾ïÁ¦¿äÀÎ
      • Å×½ºÆ® ÀåÄ¡ÀÇ °íºñ¿ë
    • ±âȸ
      • Â÷¼¼´ë SoC Å×½ºÅÍ¿Í ATEÀÇ ±Ù´ëÈ­
      • ÀÚÀ²ÁÖÇàÂ÷ ¹× ¹«ÀοîÀüÂ÷ Å×½ºÆ®ÀÇ ÀáÀçÀûÀÎ ¿ä°Ç
    • °úÁ¦
      • ¹ÝµµÃ¼ ATE¿Í °ü·ÃµÈ ±â¼úÀû °úÁ¦
      • ÀÎ½Ä ºÎÁ·°ú ±â¼ú ¼÷·ÃÀÚÀÇ ºÎÁ·
  • ½ÃÀå ¼¼ºÐÈ­ ºÐ¼®
  • Porter's Five Forces ºÐ¼®
  • PESTEL ºÐ¼®
    • Á¤Ä¡Àû
    • °æÁ¦
    • »ç±³
    • ±â¼úÀû
    • ¹ý·ü»ó
    • ȯ°æ

Á¦6Àå ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå : À¯Çüº°

  • ÀÌ»ê ATE
  • ¸Þ¸ð¸® ATE
    • Ç÷¡½Ã µå¶óÀ̺ê
    • Çϵåµð½ºÅ© µå¶óÀ̺ê
    • ·£´ý ¾×¼¼½º ¸Þ¸ð¸®
    • Àбâ Àü¿ë ¸Þ¸ð¸®
    • SSD

Á¦7Àå ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå : Á¦Ç°º°

  • »óÈ£ ¿¬°á ¹× °ËÁõ Å×½ºÆ®
    • º£¾î º¸µå ÀÚµ¿ Å×½ºÆ®
    • ÄÉÀÌºí ¹× Çϳ׽ºÅ×½ºÅÍ
  • ·ÎÁ÷ Å×½ºÆ®
    • ¼±Çü ¶Ç´Â È¥ÇÕ ½ÅÈ£ Å×½ºÆ® ÀåÄ¡
    • ¼öµ¿ ºÎǰ ATE
  • PCB Å×½ºÆ®
    • Àμ­Å¶ ºÐ¼®±â
    • Á¦Á¶ °áÇÔ ºÐ¼® ÀåÄ¡

Á¦8Àå ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå : ÄÄÆ÷³ÍÆ®º°

  • Çڵ鷯¿Í ÇÁ·Îºê
  • »ê¾÷¿ë PC
  • ¸Å½º ÀÎÅÍÄ¿³ØÆ®
  • ½ÅÈ£¿ø
  • ¼ÒÇÁÆ®¿þ¾î
  • ½ÃÇè±â±â
    • ÀÓÀÇ ÆÄÇü ¹ß»ý±â
    • µðÁöÅÐ ¸ÖƼ¹ÌÅÍ
    • µðÁöÅÐ ½ºÅ丮Áö ¿À½Ç·Î½ºÄÚÇÁ
    • LCR ¹ÌÅÍ
    • RF ½ÅÈ£ »ý¼º

Á¦9Àå ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå : ¿ëµµº°

  • Ç×°ø¿ìÁÖ ¹× ¹æÀ§
  • ÀÚµ¿Â÷ ¹× ¿î¼Û
  • È­ÇÐÁ¦Ç° ¹× Àç·á
  • ¼ÒºñÀç ¹× ¼Ò¸Å
  • ¿¡³ÊÁö ¹× õ¿¬ÀÚ¿ø
  • À½½Ä
  • ÇコÄÉ¾î ¹× »ý¸í°úÇÐ
  • Á¦Á¶ ¹× °Ç¼³
  • ÀǾàǰ
  • Åë½Å ¹× ÄÄÇ»ÆÃ

Á¦10Àå ¾Æ¸Þ¸®Ä«ÀÇ ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå

  • ¾Æ¸£ÇîÆ¼³ª
  • ºê¶óÁú
  • ij³ª´Ù
  • ¸ß½ÃÄÚ
  • ¹Ì±¹

Á¦11Àå ¾Æ½Ã¾ÆÅÂÆò¾çÀÇ ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå

  • È£ÁÖ
  • Áß±¹
  • Àεµ
  • Àεµ³×½Ã¾Æ
  • ÀϺ»
  • ¸»·¹À̽þÆ
  • Çʸ®ÇÉ
  • ½Ì°¡Æ÷¸£
  • Çѱ¹
  • ´ë¸¸
  • ű¹
  • º£Æ®³²

Á¦12Àå À¯·´, Áßµ¿ ¹× ¾ÆÇÁ¸®Ä«ÀÇ ¹ÝµµÃ¼ ÀÚµ¿ Å×½ºÆ® ÀåÄ¡ ½ÃÀå

  • µ§¸¶Å©
  • ÀÌÁýÆ®
  • Çɶõµå
  • ÇÁ¶û½º
  • µ¶ÀÏ
  • À̽º¶ó¿¤
  • ÀÌÅ»¸®¾Æ
  • ³×´ú¶õµå
  • ³ªÀÌÁö¸®¾Æ
  • ³ë¸£¿þÀÌ
  • Æú¶õµå
  • īŸ¸£
  • ·¯½Ã¾Æ
  • »ç¿ìµð¾Æ¶óºñ¾Æ
  • ³²¾ÆÇÁ¸®Ä«
  • ½ºÆäÀÎ
  • ½º¿þµ§
  • ½ºÀ§½º
  • ÅÍŰ
  • ¾Æ¶ø¿¡¹Ì¸®Æ®(UAE)
  • ¿µ±¹

Á¦13Àå °æÀï ±¸µµ

  • ½ÃÀå Á¡À¯À² ºÐ¼®(2023³â)
  • FPNV Æ÷Áö¼Å´× ¸ÅÆ®¸¯½º(2023³â)
  • °æÀï ½Ã³ª¸®¿À ºÐ¼®
  • Àü·« ºÐ¼® ¹× Á¦¾È

±â¾÷ ¸ñ·Ï

  • Advanced Micro Devices, Inc.
  • Advantest Corporation
  • Aehr Test Systems
  • Aemulus Holdings Berhad
  • Astronics Corporation
  • Averna Technologies Inc.
  • Chroma ATE, Inc.
  • Cohu, Inc.
  • Danaher Corporation
  • Intepro Systems America, LP
  • JTAG Technologies BV
  • MAC Panel Company
  • Marvin Test Solutions, Inc.
  • Micronics Japan Co., Ltd.
  • National Instruments Corporation
  • Roos Instruments, Inc.
  • Rucker Kolls Inc.
  • Scientific Test, Inc.
  • Sparcz Engineering, Inc.
  • SPEA SpA
  • STAr Technologies Inc.
  • Teradyne, Inc.
  • TESEC Corporation
  • Testamatic Systems Pvt. Ltd.
  • Tokyo Seimitsu Co., Ltd.
  • Trenton Systems, Inc.
  • Vaunix Technology Corporation
  • Virginia Panel Corporation
  • ViTrox Corporation Berhad
  • Wewon Environmental Chambers Co., Ltd.
AJY 24.12.02

The Semiconductor Automated Test Equipment Market was valued at USD 8.00 billion in 2023, expected to reach USD 8.42 billion in 2024, and is projected to grow at a CAGR of 5.32%, to USD 11.51 billion by 2030.

The Semiconductor Automated Test Equipment (ATE) market involves systems used for testing semiconductors to ensure functionality, performance, and adherence to design requirements. This equipment is crucial for quality assurance in semiconductor manufacturing, where the focus is on minimizing defective units and ensuring reliability. The necessity of ATE arises from the growing complexity and miniaturization of semiconductor devices, requiring precise testing solutions to cater to advanced production processes. Applications of ATE span across sectors such as consumer electronics, automotive, telecommunications, and industrial domains. The end-use scope is vast, catering to semiconductor manufacturers, fabless companies, and integrated device manufacturers (IDMs), each vying to enhance the efficiency and reliability of their products.

KEY MARKET STATISTICS
Base Year [2023] USD 8.00 billion
Estimated Year [2024] USD 8.42 billion
Forecast Year [2030] USD 11.51 billion
CAGR (%) 5.32%

The market growth factors include rising demand for consumer electronics, advancements in wireless technologies like 5G, and increasing complexity in semiconductor devices, which fuel the need for robust testing solutions. Latest opportunities abound in the integration of artificial intelligence and machine learning to create next-gen ATE systems capable of predictive maintenance and adaptive testing. Companies can capitalize on these opportunities by investing in AI-enhanced ATE systems and aligning with industries requiring more sophisticated testing methods due to the exponential increase in IoT devices. However, challenges such as high equipment costs, technical complexities, and constant technological changes pose significant barriers. Innovations should focus on reducing cost per test and enhancing system flexibility to accommodate diverse semiconductor types. Developing ATE systems with modular designs can address the need for customization and scalability. Moreover, the nature of the market is dynamic and fast-paced, emphasizing continuous R&D investment.

For business growth, companies should focus on collaborative research initiatives and partnerships to foster innovation. Bridging gaps in system integration capabilities and enhancing test efficiency will cater to the rapid demand shifts and technical standards evolution. Emphasizing eco-friendly and energy-efficient systems may also attract more stakeholders, aligning with global sustainability trends.

Market Dynamics: Unveiling Key Market Insights in the Rapidly Evolving Semiconductor Automated Test Equipment Market

The Semiconductor Automated Test Equipment Market is undergoing transformative changes driven by a dynamic interplay of supply and demand factors. Understanding these evolving market dynamics prepares business organizations to make informed investment decisions, refine strategic decisions, and seize new opportunities. By gaining a comprehensive view of these trends, business organizations can mitigate various risks across political, geographic, technical, social, and economic domains while also gaining a clearer understanding of consumer behavior and its impact on manufacturing costs and purchasing trends.

  • Market Drivers
    • OEM Focus on Sophisticated Automated Testing Methods
    • Growing in Integration of Advanced Systems in Automotive & Aviation
    • Significant Surge in Consumer Electronics
  • Market Restraints
    • High Cost of Testing Equipment Device
  • Market Opportunities
    • Next-Generation SoC Testers and Modernization of ATE
    • Potential Requirements for Autonomous & Driverless Vehicle Testing
  • Market Challenges
    • Technical Challenges Associated with Semiconductor ATE
    • Lack of Awareness and Scarcity of Technically Skilled Professionals

Porter's Five Forces: A Strategic Tool for Navigating the Semiconductor Automated Test Equipment Market

Porter's five forces framework is a critical tool for understanding the competitive landscape of the Semiconductor Automated Test Equipment Market. It offers business organizations with a clear methodology for evaluating their competitive positioning and exploring strategic opportunities. This framework helps businesses assess the power dynamics within the market and determine the profitability of new ventures. With these insights, business organizations can leverage their strengths, address weaknesses, and avoid potential challenges, ensuring a more resilient market positioning.

PESTLE Analysis: Navigating External Influences in the Semiconductor Automated Test Equipment Market

External macro-environmental factors play a pivotal role in shaping the performance dynamics of the Semiconductor Automated Test Equipment Market. Political, Economic, Social, Technological, Legal, and Environmental factors analysis provides the necessary information to navigate these influences. By examining PESTLE factors, businesses can better understand potential risks and opportunities. This analysis enables business organizations to anticipate changes in regulations, consumer preferences, and economic trends, ensuring they are prepared to make proactive, forward-thinking decisions.

Market Share Analysis: Understanding the Competitive Landscape in the Semiconductor Automated Test Equipment Market

A detailed market share analysis in the Semiconductor Automated Test Equipment Market provides a comprehensive assessment of vendors' performance. Companies can identify their competitive positioning by comparing key metrics, including revenue, customer base, and growth rates. This analysis highlights market concentration, fragmentation, and trends in consolidation, offering vendors the insights required to make strategic decisions that enhance their position in an increasingly competitive landscape.

FPNV Positioning Matrix: Evaluating Vendors' Performance in the Semiconductor Automated Test Equipment Market

The Forefront, Pathfinder, Niche, Vital (FPNV) Positioning Matrix is a critical tool for evaluating vendors within the Semiconductor Automated Test Equipment Market. This matrix enables business organizations to make well-informed decisions that align with their goals by assessing vendors based on their business strategy and product satisfaction. The four quadrants provide a clear and precise segmentation of vendors, helping users identify the right partners and solutions that best fit their strategic objectives.

Strategy Analysis & Recommendation: Charting a Path to Success in the Semiconductor Automated Test Equipment Market

A strategic analysis of the Semiconductor Automated Test Equipment Market is essential for businesses looking to strengthen their global market presence. By reviewing key resources, capabilities, and performance indicators, business organizations can identify growth opportunities and work toward improvement. This approach helps businesses navigate challenges in the competitive landscape and ensures they are well-positioned to capitalize on newer opportunities and drive long-term success.

Key Company Profiles

The report delves into recent significant developments in the Semiconductor Automated Test Equipment Market, highlighting leading vendors and their innovative profiles. These include Advanced Micro Devices, Inc., Advantest Corporation, Aehr Test Systems, Aemulus Holdings Berhad, Astronics Corporation, Averna Technologies Inc., Chroma ATE, Inc., Cohu, Inc., Danaher Corporation, Intepro Systems America, LP, JTAG Technologies B.V., MAC Panel Company, Marvin Test Solutions, Inc., Micronics Japan Co., Ltd., National Instruments Corporation, Roos Instruments, Inc., Rucker Kolls Inc., Scientific Test, Inc., Sparcz Engineering, Inc., SPEA S.p.A., STAr Technologies Inc., Teradyne, Inc., TESEC Corporation, Testamatic Systems Pvt. Ltd., Tokyo Seimitsu Co., Ltd., Trenton Systems, Inc., Vaunix Technology Corporation, Virginia Panel Corporation, ViTrox Corporation Berhad, and Wewon Environmental Chambers Co., Ltd..

Market Segmentation & Coverage

This research report categorizes the Semiconductor Automated Test Equipment Market to forecast the revenues and analyze trends in each of the following sub-markets:

  • Based on Type, market is studied across Discrete ATE and Memory ATE. The Memory ATE is further studied across Flash Drive, Hard Disk Drives, Random Access Memory, Read-Only Memory, and Solid-State Drive.
  • Based on Product, market is studied across Interconnection & Verification Testing, Logic Testing, and Printed Circuit Board Testing. The Interconnection & Verification Testing is further studied across Bare Board Automated Test and Cable & Harness Testers. The Logic Testing is further studied across Linear or Mixed signal Test Equipment and Passive Component ATEs. The Printed Circuit Board Testing is further studied across In-circuit Analyzers and Manufacturing Defect Analyzers.
  • Based on Component, market is studied across Handler & Probes, Industrial PC, Mass Interconnect, Signal Sources, Software, and Test Instruments. The Test Instruments is further studied across Arbitrary Waveform Generators, Digital Multimeters, Digital Storage Oscilloscopes, LCR Meters, and RF Signal Generation.
  • Based on Application, market is studied across Aerospace & Defense, Automotive & Transportation, Chemicals & Materials, Consumer Goods & Retail, Energy & Natural Resources, Food & Beverage, Healthcare & Life Sciences, Manufacturing & Construction, Pharmaceuticals, and Telecommunications & Computing.
  • Based on Region, market is studied across Americas, Asia-Pacific, and Europe, Middle East & Africa. The Americas is further studied across Argentina, Brazil, Canada, Mexico, and United States. The United States is further studied across California, Florida, Illinois, New York, Ohio, Pennsylvania, and Texas. The Asia-Pacific is further studied across Australia, China, India, Indonesia, Japan, Malaysia, Philippines, Singapore, South Korea, Taiwan, Thailand, and Vietnam. The Europe, Middle East & Africa is further studied across Denmark, Egypt, Finland, France, Germany, Israel, Italy, Netherlands, Nigeria, Norway, Poland, Qatar, Russia, Saudi Arabia, South Africa, Spain, Sweden, Switzerland, Turkey, United Arab Emirates, and United Kingdom.

The report offers a comprehensive analysis of the market, covering key focus areas:

1. Market Penetration: A detailed review of the current market environment, including extensive data from top industry players, evaluating their market reach and overall influence.

2. Market Development: Identifies growth opportunities in emerging markets and assesses expansion potential in established sectors, providing a strategic roadmap for future growth.

3. Market Diversification: Analyzes recent product launches, untapped geographic regions, major industry advancements, and strategic investments reshaping the market.

4. Competitive Assessment & Intelligence: Provides a thorough analysis of the competitive landscape, examining market share, business strategies, product portfolios, certifications, regulatory approvals, patent trends, and technological advancements of key players.

5. Product Development & Innovation: Highlights cutting-edge technologies, R&D activities, and product innovations expected to drive future market growth.

The report also answers critical questions to aid stakeholders in making informed decisions:

1. What is the current market size, and what is the forecasted growth?

2. Which products, segments, and regions offer the best investment opportunities?

3. What are the key technology trends and regulatory influences shaping the market?

4. How do leading vendors rank in terms of market share and competitive positioning?

5. What revenue sources and strategic opportunities drive vendors' market entry or exit strategies?

Table of Contents

1. Preface

  • 1.1. Objectives of the Study
  • 1.2. Market Segmentation & Coverage
  • 1.3. Years Considered for the Study
  • 1.4. Currency & Pricing
  • 1.5. Language
  • 1.6. Stakeholders

2. Research Methodology

  • 2.1. Define: Research Objective
  • 2.2. Determine: Research Design
  • 2.3. Prepare: Research Instrument
  • 2.4. Collect: Data Source
  • 2.5. Analyze: Data Interpretation
  • 2.6. Formulate: Data Verification
  • 2.7. Publish: Research Report
  • 2.8. Repeat: Report Update

3. Executive Summary

4. Market Overview

5. Market Insights

  • 5.1. Market Dynamics
    • 5.1.1. Drivers
      • 5.1.1.1. OEM Focus on Sophisticated Automated Testing Methods
      • 5.1.1.2. Growing in Integration of Advanced Systems in Automotive & Aviation
      • 5.1.1.3. Significant Surge in Consumer Electronics
    • 5.1.2. Restraints
      • 5.1.2.1. High Cost of Testing Equipment Device
    • 5.1.3. Opportunities
      • 5.1.3.1. Next-Generation SoC Testers and Modernization of ATE
      • 5.1.3.2. Potential Requirements for Autonomous & Driverless Vehicle Testing
    • 5.1.4. Challenges
      • 5.1.4.1. Technical Challenges Associated with Semiconductor ATE
      • 5.1.4.2. Lack of Awareness and Scarcity of Technically Skilled Professionals
  • 5.2. Market Segmentation Analysis
  • 5.3. Porter's Five Forces Analysis
    • 5.3.1. Threat of New Entrants
    • 5.3.2. Threat of Substitutes
    • 5.3.3. Bargaining Power of Customers
    • 5.3.4. Bargaining Power of Suppliers
    • 5.3.5. Industry Rivalry
  • 5.4. PESTLE Analysis
    • 5.4.1. Political
    • 5.4.2. Economic
    • 5.4.3. Social
    • 5.4.4. Technological
    • 5.4.5. Legal
    • 5.4.6. Environmental

6. Semiconductor Automated Test Equipment Market, by Type

  • 6.1. Introduction
  • 6.2. Discrete ATE
  • 6.3. Memory ATE
    • 6.3.1. Flash Drive
    • 6.3.2. Hard Disk Drives
    • 6.3.3. Random Access Memory
    • 6.3.4. Read-Only Memory
    • 6.3.5. Solid-State Drive

7. Semiconductor Automated Test Equipment Market, by Product

  • 7.1. Introduction
  • 7.2. Interconnection & Verification Testing
    • 7.2.1. Bare Board Automated Test
    • 7.2.2. Cable & Harness Testers
  • 7.3. Logic Testing
    • 7.3.1. Linear or Mixed signal Test Equipment
    • 7.3.2. Passive Component ATEs
  • 7.4. Printed Circuit Board Testing
    • 7.4.1. In-circuit Analyzers
    • 7.4.2. Manufacturing Defect Analyzers

8. Semiconductor Automated Test Equipment Market, by Component

  • 8.1. Introduction
  • 8.2. Handler & Probes
  • 8.3. Industrial PC
  • 8.4. Mass Interconnect
  • 8.5. Signal Sources
  • 8.6. Software
  • 8.7. Test Instruments
    • 8.7.1. Arbitrary Waveform Generators
    • 8.7.2. Digital Multimeters
    • 8.7.3. Digital Storage Oscilloscopes
    • 8.7.4. LCR Meters
    • 8.7.5. RF Signal Generation

9. Semiconductor Automated Test Equipment Market, by Application

  • 9.1. Introduction
  • 9.2. Aerospace & Defense
  • 9.3. Automotive & Transportation
  • 9.4. Chemicals & Materials
  • 9.5. Consumer Goods & Retail
  • 9.6. Energy & Natural Resources
  • 9.7. Food & Beverage
  • 9.8. Healthcare & Life Sciences
  • 9.9. Manufacturing & Construction
  • 9.10. Pharmaceuticals
  • 9.11. Telecommunications & Computing

10. Americas Semiconductor Automated Test Equipment Market

  • 10.1. Introduction
  • 10.2. Argentina
  • 10.3. Brazil
  • 10.4. Canada
  • 10.5. Mexico
  • 10.6. United States

11. Asia-Pacific Semiconductor Automated Test Equipment Market

  • 11.1. Introduction
  • 11.2. Australia
  • 11.3. China
  • 11.4. India
  • 11.5. Indonesia
  • 11.6. Japan
  • 11.7. Malaysia
  • 11.8. Philippines
  • 11.9. Singapore
  • 11.10. South Korea
  • 11.11. Taiwan
  • 11.12. Thailand
  • 11.13. Vietnam

12. Europe, Middle East & Africa Semiconductor Automated Test Equipment Market

  • 12.1. Introduction
  • 12.2. Denmark
  • 12.3. Egypt
  • 12.4. Finland
  • 12.5. France
  • 12.6. Germany
  • 12.7. Israel
  • 12.8. Italy
  • 12.9. Netherlands
  • 12.10. Nigeria
  • 12.11. Norway
  • 12.12. Poland
  • 12.13. Qatar
  • 12.14. Russia
  • 12.15. Saudi Arabia
  • 12.16. South Africa
  • 12.17. Spain
  • 12.18. Sweden
  • 12.19. Switzerland
  • 12.20. Turkey
  • 12.21. United Arab Emirates
  • 12.22. United Kingdom

13. Competitive Landscape

  • 13.1. Market Share Analysis, 2023
  • 13.2. FPNV Positioning Matrix, 2023
  • 13.3. Competitive Scenario Analysis
  • 13.4. Strategy Analysis & Recommendation

Companies Mentioned

  • 1. Advanced Micro Devices, Inc.
  • 2. Advantest Corporation
  • 3. Aehr Test Systems
  • 4. Aemulus Holdings Berhad
  • 5. Astronics Corporation
  • 6. Averna Technologies Inc.
  • 7. Chroma ATE, Inc.
  • 8. Cohu, Inc.
  • 9. Danaher Corporation
  • 10. Intepro Systems America, LP
  • 11. JTAG Technologies B.V.
  • 12. MAC Panel Company
  • 13. Marvin Test Solutions, Inc.
  • 14. Micronics Japan Co., Ltd.
  • 15. National Instruments Corporation
  • 16. Roos Instruments, Inc.
  • 17. Rucker Kolls Inc.
  • 18. Scientific Test, Inc.
  • 19. Sparcz Engineering, Inc.
  • 20. SPEA S.p.A.
  • 21. STAr Technologies Inc.
  • 22. Teradyne, Inc.
  • 23. TESEC Corporation
  • 24. Testamatic Systems Pvt. Ltd.
  • 25. Tokyo Seimitsu Co., Ltd.
  • 26. Trenton Systems, Inc.
  • 27. Vaunix Technology Corporation
  • 28. Virginia Panel Corporation
  • 29. ViTrox Corporation Berhad
  • 30. Wewon Environmental Chambers Co., Ltd.
ºñ±³¸®½ºÆ®
0 °ÇÀÇ »óǰÀ» ¼±Åà Áß
»óǰ ºñ±³Çϱâ
Àüü»èÁ¦