½ÃÀ庸°í¼­
»óǰÄÚµå
1423604

¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ¼¼°è ½ÃÀå ¿¹Ãø(-2030³â) : À¯Çüº°, ±â´Éº°, ±â¼úº°, ¿ëµµº°, Áö¿ªº° ¼¼°è ºÐ¼®

Semiconductor Inspection and Measurement Equipment Market Forecasts to 2030 - Global Analysis By Type, Function, Technology, Application and By Geography

¹ßÇàÀÏ: | ¸®¼­Ä¡»ç: Stratistics Market Research Consulting | ÆäÀÌÁö Á¤º¸: ¿µ¹® 200+ Pages | ¹è¼Û¾È³» : 2-3ÀÏ (¿µ¾÷ÀÏ ±âÁØ)

    
    
    



¡Ø º» »óǰÀº ¿µ¹® ÀÚ·á·Î Çѱ۰ú ¿µ¹® ¸ñÂ÷¿¡ ºÒÀÏÄ¡ÇÏ´Â ³»¿ëÀÌ ÀÖÀ» °æ¿ì ¿µ¹®À» ¿ì¼±ÇÕ´Ï´Ù. Á¤È®ÇÑ °ËÅ並 À§ÇØ ¿µ¹® ¸ñÂ÷¸¦ Âü°íÇØÁֽñ⠹ٶø´Ï´Ù.

Stratistics MRC¿¡ µû¸£¸é, ¼¼°è ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀåÀº ¿¹Ãø ±â°£ µ¿¾È CAGR 5.2%·Î ¼ºÀåÇÒ °ÍÀ¸·Î ¿¹»óµË´Ï´Ù.

¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ´Â ¹ÝµµÃ¼ ¼ÒÀÚ, Ĩ ¹× ÁýÀûȸ·Î(IC)ÀÇ Ç°Áú, Á¤È®¼º ¹× ½Å·Ú¼ºÀ» º¸ÀåÇϱâ À§ÇØ ¹ÝµµÃ¼ Á¦Á¶ °øÁ¤¿¡¼­ »ç¿ëµÇ´Â Ư¼ö µµ±¸ ¹× ½Ã½ºÅÛ ¼¼Æ®ÀÔ´Ï´Ù. ÀÌ·¯ÇÑ µµ±¸´Â ¿þÀÌÆÛ °Ë»ç, °áÇÔ °¨Áö, ÃøÁ¤(Ä¡¼ö ¹× Ư¼º ÃøÁ¤), °øÁ¤ Á¦¾î µî ¹ÝµµÃ¼ Á¦Á¶ÀÇ ¿©·¯ ´Ü°è¿¡¼­ Áß¿äÇÑ ¿ªÇÒÀ» ¼öÇàÇÕ´Ï´Ù.

SEMI¿¡ µû¸£¸é 2022³â Àü ¼¼°è ½Ç¸®ÄÜ ¿þÀÌÆÛ ÃâÇÏ ¸éÀûÀº 1471¾ï 1,000¸¸ Æò¹æÀÎÄ¡·Î 2021³â 1416¾ï 6,000¸¸ Æò¹æÀÎÄ¡¿¡¼­ Áõ°¡Çß´Ù°í ÇÕ´Ï´Ù.

¹ÝµµÃ¼ ¼ö¿äÀÇ Áõ°¡

IoT, 5G, AI, Àü±âÀÚµ¿Â÷ µî ±â¼úÀÇ ±Þ¼ÓÇÑ º¸±ÞÀ¸·Î ¹ÝµµÃ¼ ¼ö¿ä°¡ ±ÞÁõÇϸ鼭 Á¤¹ÐÇÏ°í °íǰÁúÀÇ ¹ÝµµÃ¼ Ĩ¿¡ ´ëÇÑ Çʿ伺ÀÌ ³ô¾ÆÁö°í ÀÖ½À´Ï´Ù. ÀÌ·¯ÇÑ ±ÞÁõÀº ¾ö°ÝÇÑ Ç°Áú °ü¸®¸¦ º¸ÀåÇϰí, °áÇÔÀ» °¨ÁöÇϰí, Á¦Á¶ °øÁ¤À» ÃÖÀûÈ­Çϱâ À§ÇÑ Ã·´Ü °Ë»ç ¹× ÃøÁ¤ Àåºñ¸¦ ÇÊ¿ä·Î ÇÕ´Ï´Ù. °¢ »ê¾÷ÀÌ ¹ÝµµÃ¼ ´ëÀÀ ±â¼ú¿¡ Å©°Ô ÀÇÁ¸ÇÏ´Â °¡¿îµ¥, ½Å·ÚÇÒ ¼ö ÀÖ°í È¿À²ÀûÀÎ °Ë»ç ¹× ÃøÁ¤ Àåºñ¿¡ ´ëÇÑ ¼ö¿ä°¡ Áõ°¡Çϸ鼭 ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀåÀÇ ¼ºÀåÀ» ÁÖµµÇϰí ÀÖ½À´Ï´Ù.

ÀåºñÀÇ ³ôÀº ºñ¿ë

¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ´Â Á¤±³ÇÑ ±â¼ú, Á¤È®µµ ¿ä±¸ »çÇ×, ÁøÈ­ÇÏ´Â Á¦Á¶ Ç¥ÁØ¿¡ ¸ÂÃß±â À§ÇÑ ÀæÀº ¾÷±×·¹À̵åÀÇ Çʿ伺À¸·Î ÀÎÇØ ¸¹Àº ÅõÀÚ°¡ ÇÊ¿äÇÕ´Ï´Ù. ÀÌ·¯ÇÑ °æÁ¦Àû ºÎ´ãÀº ƯÈ÷ ¼Ò±Ô¸ð Á¦Á¶¾÷ü³ª ¿¹»êÀÌ ÇÑÁ¤µÈ Á¦Á¶¾÷üÀÇ °æ¿ì, ÷´Ü Àåºñ¿¡ ´ëÇÑ Á¢±Ù¼ºÀ» Á¦ÇÑÇϰí Á¢±Ù¼ºÀ» ÀúÇØÇÒ ¼ö ÀÖ½À´Ï´Ù. ±× °á°ú, °¡°Ý ºÎ´ãÀº ¹ÝµµÃ¼ »ê¾÷ÀÇ °æÀï·ÂÀ» ÀúÇØÇÏ´Â ¿äÀÎÀ¸·Î ÀÛ¿ëÇϰí ÀÖ½À´Ï´Ù.

°í¼º´É ¹ÝµµÃ¼ Ĩ¿¡ ´ëÇÑ ¼ö¿ä Áõ°¡

±â¼úÀÇ ¹ßÀüÀ¸·Î AI, °í¼Ó ÄÄÇ»ÆÃ, Åë½Å°ú °°Àº ¾ÖÇø®ÄÉÀ̼ÇÀ» À§ÇÑ ´õ ºü¸£°í °í¼º´É Ĩ¿¡ ´ëÇÑ Çʿ伺ÀÌ Áõ°¡ÇÔ¿¡ µû¶ó Á¤¹ÐÇÏ°í ½Å·ÚÇÒ ¼ö ÀÖ´Â °Ë»ç µµ±¸¿¡ ´ëÇÑ ¿ä±¸µµ Áõ°¡Çϰí ÀÖ½À´Ï´Ù. ÀÌ·¯ÇÑ ¼ö¿ä´Â ¾ö°ÝÇÑ Ç°Áú °ü¸®¸¦ º¸ÀåÇϰí, °áÇÔÀ» °¨ÁöÇϰí, °í¼º´É ĨÀÇ º¹ÀâÇÑ ±â´ÉÀ» °ËÁõÇÒ ¼ö Àִ ÷´Ü Àåºñ¸¦ ÇÊ¿ä·Î ÇÕ´Ï´Ù. ±× °á°ú, ÷´Ü ¹ÝµµÃ¼ ¼ÒÀÚ Á¦Á¶¿¡ ´ëÇÑ ÁøÈ­ÇÏ´Â ¿ä±¸ »çÇ×À» ÃæÁ·Çϱâ À§ÇØ Ã·´Ü °Ë»ç ¹× ÃøÁ¤ ¼Ö·ç¼Ç¿¡ ´ëÇÑ Çõ½Å°ú ÅõÀÚ°¡ ÃËÁøµÇ¾î ½ÃÀå ¼ºÀå°ú °³Ã´À» ÃËÁøÇϰí ÀÖ½À´Ï´Ù.

ģȯ°æ

ÀÌ·¯ÇÑ Ã·´Ü °ø±¸ÀÇ Á¦Á¶ °øÁ¤Àº À¯ÇØ ¹°Áú »ç¿ë°ú ¿¡³ÊÁö Áý¾àÀûÀÎ ÀýÂ÷°¡ ¸¹¾Æ ȯ°æ¿¡ ¹ÌÄ¡´Â ¿µÇâÀÌ ¿ì·ÁµË´Ï´Ù. Æó±â¹° ó¸®, ¿¡³ÊÁö ¼Òºñ, À¯ÇØ ¹°Áú¿¡ ´ëÇÑ ¾ö°ÝÇÑ ±ÔÁ¦¸¦ ÁؼöÇϱâ À§Çؼ­´Â ȯ°æ ģȭÀûÀÎ Á¦Á¶ ¹æ½Ä¿¡ ¸¹Àº ÅõÀÚ¸¦ ÇØ¾ß ÇÕ´Ï´Ù. ÀÌ·¯ÇÑ ¹®Á¦¸¦ ÇØ°áÇÏÁö ¸øÇÏ¸é ¿î¿µ ºñ¿ë Áõ°¡, ½ÃÀå ¼ö¿ë¼º Á¦ÇÑ, ±ÔÁ¦ ¹ÌÁؼö·Î À̾îÁ® ¼ºÀå°ú ½ÃÀåÀ» ÀúÇØÇÒ ¼ö ÀÖ½À´Ï´Ù.

COVID-19ÀÇ ¿µÇâ

COVID-19´Â Ãʱ⿡´Â °ø±Þ¸Á È¥¶õ, »ý»ê Á¤Ã¼, Àåºñ ³³Ç° Áö¿¬À» ÀÏÀ¸Ä×½À´Ï´Ù. ±×·¯³ª ¿ø°Ý ±Ù¹«ÀÇ ±ÞÁõ, µðÁöÅÐÈ­ ¹× ÀüÀÚ Àåºñ¿¡ ´ëÇÑ ¼ö¿ä Áõ°¡·Î ÀÎÇØ ¹ÝµµÃ¼ Ĩ¿¡ ´ëÇÑ ¿ä±¸ »çÇ×ÀÌ Áõ°¡Çß½À´Ï´Ù. ÀÌ¿¡ µû¶ó ǰÁú ±âÁØÀ» À¯ÁöÇϱâ À§ÇÑ °Ë»ç ¹× ÃøÁ¤ Àåºñ¿¡ ´ëÇÑ ¿ä±¸°¡ ³ô¾ÆÁ³½À´Ï´Ù. Àü¹ÝÀûÀ¸·Î, µµÀü¿¡ Á÷¸éÇßÀ½¿¡µµ ºÒ±¸Çϰí Àü¿°º´Àº ¹ÝµµÃ¼ ÀåÄ¡¿¡ ´ëÇÑ Àå±âÀûÀÎ ¼ö¿ä¸¦ ÃËÁøÇÏ¿© °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀåÀÇ Áö¼ÓÀûÀÎ ¼ºÀåÀ» ÃËÁøÇß½À´Ï´Ù.

¿¹Ãø ±â°£ µ¿¾È °èÃø ±â±â ºÎ¹®ÀÌ °¡Àå Å« ºñÁßÀ» Â÷ÁöÇÒ °ÍÀ¸·Î ¿¹»ó

ÃøÁ¤ Àåºñ ºÐ¾ß°¡ °¡Àå Å« ºñÁßÀ» Â÷ÁöÇÒ °ÍÀ¸·Î ÃßÁ¤µË´Ï´Ù. °èÃø Àåºñ´Â Áß¿äÇÑ Ä¡¼ö, Ç¥¸é Çü»ó, Çʸ§ µÎ²² ¹× ±âŸ Ư¼ºÀ» ³ª³ë¹ÌÅÍ ´ÜÀ§·Î ÃøÁ¤ÇÏ¿© ¹ÝµµÃ¼ ºÎǰ ¹× Àç·áÀÇ Ç°Áú, Á¤È®¼º ¹× ÀûÇÕ¼ºÀ» º¸ÀåÇÕ´Ï´Ù. ¶ÇÇÑ ±¤ÇÐ, ÁÖ»çÀüÀÚÇö¹Ì°æ(SEM), ¿øÀÚ°£ÈûÇö¹Ì°æ(AFM) µî ÷´Ü ±â¼úÀ» »ç¿ëÇÏ¿© ¹ÝµµÃ¼ÀÇ Æ¯¼ºÀ» öÀúÇÏ°Ô °Ë»çÇÏ°í °ËÁõÇÔÀ¸·Î½á Á¦Á¶ °øÁ¤ Àü¹Ý¿¡ °ÉÃÄ ¼³°è »ç¾ç°ú ǰÁú Ç¥ÁØÀ» ÁؼöÇϵµ·Ï º¸ÀåÇÕ´Ï´Ù.

¿¹Ãø ±â°£ µ¿¾È ¿þÀÌÆÛ ¼¼ºÐÈ­°¡ °¡Àå ³ôÀº CAGRÀ» ±â·ÏÇÒ °ÍÀ¸·Î ¿¹»óµË´Ï´Ù.

¿þÀÌÆÛ ºÐ¾ß´Â ¿¹Ãø ±â°£ µ¿¾È À¯¸®ÇÑ ¼ºÀåÀ» ÀÌ·ê °ÍÀ¸·Î ¿¹»óµË´Ï´Ù. ¿þÀÌÆÛ´Â ½Ç¸®Äܰú °°Àº ¹ÝµµÃ¼ Àç·á·Î ¸¸µé¾îÁø ¾ãÀº ¿ø¹Ý ¸ð¾çÀÇ ±âÆÇÀ» ¸»ÇÕ´Ï´Ù. ÀÌ ¿þÀÌÆÛ´Â ÁýÀûȸ·Î(IC)¿Í ¸¶ÀÌÅ©·ÎĨÀ» Á¦Á¶Çϱâ À§ÇÑ ±âÃÊ Àç·á·Î »ç¿ëµË´Ï´Ù. ¿þÀÌÆÛ °Ë»ç ¹× ÃøÁ¤ Àåºñ¿¡´Â ÀÌ·¯ÇÑ ¿þÀÌÆÛÀÇ Ç°Áú, ±ÕÀϼº, °áÇÔ ¹× Áß¿äÇÑ ¸Å°³ º¯¼ö¸¦ °Ë»çÇÏ°í Æò°¡Çϱâ À§ÇØ ¼³°èµÈ Ư¼ö µµ±¸ ¹× ½Ã½ºÅÛÀÌ Æ÷ÇԵ˴ϴÙ. ¶ÇÇÑ, ÀÌ·¯ÇÑ µµ±¸´Â ¹ÝµµÃ¼ Á¦Á¶ °øÁ¤ Àü¹Ý¿¡ °ÉÃÄ ¿þÀÌÆÛÀÇ ¹«°á¼º, Á¤È®¼º, ½Å·Ú¼ºÀ» º¸ÀåÇϰí ĨÀÇ ¼öÀ²°ú ¼º´ÉÀ» ÃÖÀûÈ­ÇÏ´Â µ¥ ¸Å¿ì Áß¿äÇÕ´Ï´Ù.

ÃÖ´ë ½ÃÀå Á¡À¯À² Áö¿ª

¾Æ½Ã¾ÆÅÂÆò¾çÀº ¹ÝµµÃ¼ Á¦Á¶ ºÐ¾ß¿¡¼­ ¿ìÀ§¸¦ Á¡Çϰí ÀÖ¾î ¿¹Ãø ±â°£ µ¿¾È °¡Àå Å« ½ÃÀå Á¡À¯À²À» Â÷ÁöÇÒ °ÍÀ¸·Î ¿¹»óµË´Ï´Ù. ÀÌ Áö¿ªÀÇ ¼ºÀåÀº ±â¼ú ¹ßÀü, ¼ÒºñÀÚ ÀüÀÚÁ¦Ç°¿¡ ´ëÇÑ ¼ö¿ä Áõ°¡, ±Þ¼ÓÇÑ »ê¾÷È­¿¡ ÈûÀÔ¾î ¼ºÀåÇϰí ÀÖÀ¸¸ç, ASML, µµÄì ÀÏ·ºÆ®·Ð, ÇöÁö ±â¾÷µéÀ» Æ÷ÇÔÇÑ ÀÌ Áö¿ª ±â¾÷µéÀº ÷´Ü °Ë»ç ¹× ÃøÁ¤ Àåºñ¿¡ ´ëÇÑ ¼ö¿ä Áõ°¡¿¡ ´ëÀÀÇϱâ À§ÇØ Àû±ØÀûÀ¸·Î Çõ½ÅÇϰí ÀÖÀ¸¸ç, ÀÌ´Â ¾Æ½Ã¾ÆÅÂÆò¾çÀÇ ¹ÝµµÃ¼ »ê¾÷¿¡¼­ Áß¿äÇÑ ½ÃÀå ÃËÁø¿äÀÎÀ¸·Î ÀÛ¿ëÇϰí ÀÖ½À´Ï´Ù. ¾Æ½Ã¾ÆÅÂÆò¾çÀÇ ¹ÝµµÃ¼ »ê¾÷¿¡¼­ Áß¿äÇÑ ½ÃÀå ÃËÁøÁ¦·Î¼­ÀÇ ÀÔÁö¸¦ ´õ¿í °ø°íÈ÷ Çϰí ÀÖ½À´Ï´Ù.

CAGRÀÌ °¡Àå ³ôÀº Áö¿ª:

ºÏ¹Ì´Â ±â¼ú Çõ½Å°ú źźÇÑ ¹ÝµµÃ¼ »ýŰè·Î ÀÎÇØ ¿¹Ãø ±â°£ µ¿¾È ¼öÀͼº ÀÖ´Â ¼ºÀåÀ» ÀÌ·ê °ÍÀ¸·Î ¿¹»óµË´Ï´Ù. ¹Ì±¹Àº ÁÖ¿ä ¹ÝµµÃ¼ Á¦Á¶¾÷ü¿Í ±â¼ú ´ë±â¾÷ÀÌ ¹ÐÁýÇØ ÀÖ¾î ¸Å¿ì Áß¿äÇÑ ¿ªÇÒÀ» Çϰí ÀÖ½À´Ï´Ù. Applied Materials, KLA Corporation, Nanometrics¿Í °°Àº ±â¾÷µéÀº °Ë»ç ¹× ÃøÁ¤ ¼Ö·ç¼ÇÀÇ ¹ßÀüÀ» ÁÖµµÇϰí ÀÖ½À´Ï´Ù. ¶ÇÇÑ, °í¼º´É ÄÄÇ»ÆÃ, ÀΰøÁö´É, Â÷·®¿ë ÀüÀÚÁ¦Ç°¿¡ ´ëÇÑ ¼ö¿ä Áõ°¡¿Í ÇÔ²² ÀÌ Áö¿ªÀÇ ¿¬±¸°³¹ß¿¡ ´ëÇÑ ÁýÁßÀº ½ÃÀå ¼ºÀåÀ» µÞ¹ÞħÇϰí ÀÖ½À´Ï´Ù.

¹«·á ¸ÂÃãÇü ¼­ºñ½º:

ÀÌ º¸°í¼­¸¦ ±¸µ¶ÇÏ´Â °í°´Àº ´ÙÀ½°ú °°Àº ¹«·á ¸ÂÃãÈ­ ¿É¼Ç Áß Çϳª¸¦ »ç¿ëÇÒ ¼ö ÀÖ½À´Ï´Ù:

  • ȸ»ç ÇÁ·ÎÇÊ
    • Ãß°¡ ½ÃÀå ±â¾÷ÀÇ Á¾ÇÕÀûÀÎ ÇÁ·ÎÆÄÀϸµ(ÃÖ´ë 3°³»ç±îÁö)
    • ÁÖ¿ä ±â¾÷ SWOT ºÐ¼®(ÃÖ´ë 3°³»ç)
  • Áö¿ª ¼¼ºÐÈ­
    • °í°´ÀÇ °ü½É¿¡ µû¸¥ ÁÖ¿ä ±¹°¡º° ½ÃÀå ÃßÁ¤Ä¡, ¿¹Ãø, CAGR(ÁÖ: Ÿ´ç¼º °ËÅä¿¡ µû¸¥)
  • °æÀï»ç º¥Ä¡¸¶Å·
    • Á¦Ç° Æ÷Æ®Æú¸®¿À, Áö¸®Àû ÀÔÁö, Àü·«Àû Á¦ÈÞ¸¦ ±â¹ÝÀ¸·Î ÇÑ ÁÖ¿ä ±â¾÷ º¥Ä¡¸¶Å·

¸ñÂ÷

Á¦1Àå ÁÖ¿ä ¿ä¾à

Á¦2Àå ¼­¹®

  • °³¿ä
  • ÀÌÇØ°ü°èÀÚ
  • Á¶»ç ¹üÀ§
  • Á¶»ç ¹æ¹ý
    • µ¥ÀÌÅÍ ¸¶ÀÌ´×
    • µ¥ÀÌÅÍ ºÐ¼®
    • µ¥ÀÌÅÍ °ËÁõ
    • Á¶»ç Á¢±Ù¹ý
  • Á¶»ç ¼Ò½º
    • 1Â÷ Á¶»ç ¼Ò½º
    • 2Â÷ Á¶»ç ¼Ò½º
    • °¡Á¤

Á¦3Àå ½ÃÀå µ¿Ç⠺м®

  • ¼ºÀå ÃËÁø¿äÀÎ
  • ¼ºÀå ¾ïÁ¦¿äÀÎ
  • ±âȸ
  • À§Çù
  • ±â¼ú ºÐ¼®
  • ¿ëµµ ºÐ¼®
  • ½ÅÈï ½ÃÀå
  • ½ÅÁ¾ Äڷγª¹ÙÀÌ·¯½º °¨¿°Áõ(COVID-19)ÀÇ ¿µÇâ

Á¦4Àå Porter's Five Forces ºÐ¼®

  • °ø±Þ ±â¾÷ÀÇ ±³¼··Â
  • ±¸¸ÅÀÚÀÇ ±³¼··Â
  • ´ëüǰÀÇ À§Çù
  • ½Å±Ô Âü¿©¾÷üÀÇ À§Çù
  • °æÀï ±â¾÷ °£ÀÇ °æÀï °ü°è

Á¦5Àå ¼¼°èÀÇ ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀå : À¯Çüº°

  • °èÃø Àåºñ
  • °áÇÔ °Ë»ç Àåºñ

Á¦6Àå ¼¼°èÀÇ ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀå : ±â´Éº°

  • ÀÚµ¿ °Ë»ç ½Ã½ºÅÛ
  • ¼öµ¿ °Ë»ç ½Ã½ºÅÛ
  • ¼ÒÇÁÆ®¿þ¾î ¼Ö·ç¼Ç

Á¦7Àå ¼¼°èÀÇ ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀå : ±â¼úº°

  • ±¤ÇÐ °Ë»ç
  • ÁÖ»çÇü ÇÁ·Îºê Çö¹Ì°æ
  • ÀüÀÚ¼± °Ë»ç
  • ±âŸ ±â¼ú

Á¦8Àå ¼¼°èÀÇ ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀå : ¿ëµµº°

  • ¸¶½ºÅ©/Çʸ§
  • ¿þÀÌÆÛ
  • ÇÁ·Î¼¼½º Á¦¾î¿Í ÃÖÀûÈ­
  • ¿¬±¸°³¹ß
  • ±âŸ ¿ëµµ

Á¦9Àå ¼¼°èÀÇ ¹ÝµµÃ¼ °Ë»ç ¹× ÃøÁ¤ Àåºñ ½ÃÀå : Áö¿ªº°

  • ºÏ¹Ì
    • ¹Ì±¹
    • ij³ª´Ù
    • ¸ß½ÃÄÚ
  • À¯·´
    • µ¶ÀÏ
    • ¿µ±¹
    • ÀÌÅ»¸®¾Æ
    • ÇÁ¶û½º
    • ½ºÆäÀÎ
    • ±âŸ À¯·´
  • ¾Æ½Ã¾ÆÅÂÆò¾ç
    • ÀϺ»
    • Áß±¹
    • Àεµ
    • È£ÁÖ
    • ´ºÁú·£µå
    • Çѱ¹
    • ±âŸ ¾Æ½Ã¾ÆÅÂÆò¾ç
  • ³²¹Ì
    • ¾Æ¸£ÇîÆ¼³ª
    • ºê¶óÁú
    • Ä¥·¹
    • ±âŸ ³²¹Ì
  • Áßµ¿ ¹× ¾ÆÇÁ¸®Ä«
    • »ç¿ìµð¾Æ¶óºñ¾Æ
    • ¾Æ¶ø¿¡¹Ì¸®Æ®
    • īŸ¸£
    • ³²¾ÆÇÁ¸®Ä«°øÈ­±¹
    • ±âŸ Áßµ¿ ¹× ¾ÆÇÁ¸®Ä«

Á¦10Àå ÁÖ¿ä ¹ßÀü

  • °è¾à, ÆÄÆ®³Ê½Ê, Çù¾÷, ÇÕÀÛÅõÀÚ
  • Àμö¿Í ÇÕº´
  • ½ÅÁ¦Ç° ¹ß¸Å
  • »ç¾÷ È®´ë
  • ±âŸ ÁÖ¿ä Àü·«

Á¦11Àå ±â¾÷ °³¿ä

  • KLA Corporation
  • Hitachi High-Technologies
  • Applied Materials
  • Onto Innovation
  • ASML
  • SCREEN Semiconductor Solutions
  • Lasertec
  • Camtek
  • ZEISS
  • Toray Engineering
  • Unity Semiconductor SAS
  • Microtronic
  • RSIC
  • Muetec
  • DJEL
ksm 24.02.20

According to Stratistics MRC, the Global Semiconductor Inspection and Measurement Equipment Market is growing at a CAGR of 5.2% during the forecast period. Semiconductor inspection and measurement equipment is a set of specialised tools and systems used in the semiconductor manufacturing process to ensure the quality, accuracy, and reliability of semiconductor devices, chips, or integrated circuits (ICs). These tools play a crucial role in various stages of semiconductor production, including wafer inspection, defect detection, metrology (measuring dimensions and properties), and process control.

According to SEMI, in 2022, the silicon wafer area shipments worldwide amounted to 14.71 billion square inches, which increased from 14.16 billion square inches in 2021.

Market Dynamics:

Driver:

Increasing demand for semiconductors

The burgeoning demand for semiconductors, driven by the rapid proliferation of technologies like IoT, 5G, AI, and electric vehicles, fuels the need for precise and high-quality semiconductor chips. This surge necessitates sophisticated inspection and measurement equipment to ensure stringent quality control, detect defects, and optimise manufacturing processes. As industries across sectors rely heavily on semiconductor-enabled technologies, the demand for reliable and efficient inspection and measurement tools intensifies, driving the growth of the semiconductor inspection and measurement equipment market.

Restraint:

High cost of equipment

The semiconductor inspection and measurement equipment necessitates substantial investments due to its sophisticated technology, precision requirements, and frequent need for upgrades to align with evolving manufacturing standards. This financial burden can impede accessibility, particularly for smaller manufacturers or those with limited budgets, restricting their ability to acquire cutting-edge equipment. As a result, affordability becomes a challenge, hindering competitiveness within the semiconductor industry.

Opportunity:

Riding demand for high-performance semiconductor chips

As technological advancements drive the need for faster, more powerful chips for applications in AI, high-speed computing, and telecommunications, the requirement for precise and reliable inspection tools escalates. This demand necessitates advanced equipment capable of ensuring stringent quality control, detecting defects, and verifying intricate features on these high-performance chips. Consequently, it drives innovation and investment in sophisticated inspection and measurement solutions to meet the evolving requirements of producing cutting-edge semiconductor devices, fostering growth and development within the market.

Threat:

Environmental concerns

The manufacturing processes for these sophisticated tools often involve the use of hazardous materials and energy-intensive procedures, contributing to their environmental impact. Compliance with stringent regulations regarding waste disposal, energy consumption, and hazardous materials necessitates significant investments in eco-friendly manufacturing practices. Failure to address these concerns may result in increased operational costs, limitations in market acceptance, and regulatory non-compliance, potentially hindering growth and market

Covid-19 Impact

The COVID-19 pandemic initially caused disruptions in supply chains, production slowdowns, and delays in equipment delivery. However, the surge in remote work, digitalization, and increased demand for electronics bolstered semiconductor chip requirements. This led to a subsequent rise in the need for inspection and measurement equipment to maintain quality standards. Overall, while facing challenges, the pandemic spurred a long-term demand for semiconductor devices, driving continued growth in the inspection and measurement equipment market.

The metrology equipment segment is expected to be the largest during the forecast period

The metrology equipment segment is estimated to hold the largest share. Metrology equipment ensures the quality, accuracy, and conformity of semiconductor components and materials by measuring critical dimensions, surface topography, film thickness, and other characteristics at nanometer scales. Furthermore, metrology tools employ advanced technologies such as optical, scanning electron microscopy (SEM), and atomic force microscopy (AFM) to enable thorough examination and verification of semiconductor features, ensuring adherence to design specifications and high-quality standards throughout the manufacturing process.

The wafer segment is expected to have the highest CAGR during the forecast period

The wafer segment is anticipated to have lucrative growth during the forecast period. A wafer is a thin, disc-shaped substrate made of semiconductor materials like silicon. These wafers serve as the foundational material for manufacturing integrated circuits (ICs) and microchips. Wafer inspection and measurement equipment encompasses specialised tools and systems designed to examine and evaluate the quality, uniformity, defects, and critical parameters of these wafers. Moreover, these tools are crucial for ensuring the integrity, precision, and reliability of the wafers throughout the semiconductor fabrication process, optimising chip yield and performance.

Region with largest share:

Asia Pacific commanded the largest market share during the extrapolated period due to the region's dominance in semiconductor manufacturing. The region's growth is propelled by technological advancements, increasing demand for consumer electronics, and rapid industrialization. Companies in this region, including ASML, Tokyo Electron, and local players, are actively innovating to meet the escalating need for cutting-edge inspection and metrology equipment, further solidifying Asia Pacific's position as a crucial market driver in the semiconductor industry.

Region with highest CAGR:

North America is expected to witness profitable growth over the projection period, owing to its technological innovation and a robust semiconductor ecosystem. The United States, housing key semiconductor manufacturers and technology giants, plays a pivotal role. Companies like Applied Materials, KLA Corporation, and Nanometrics spearhead advancements in inspection and metrology solutions. Moreover, the region's focus on R&D, coupled with the increasing demand for high-performance computing, artificial intelligence, and automotive electronics, sustains the market's growth.

Key players in the market

Some of the key players in the Semiconductor Inspection and Measurement Equipment Market include KLA Corporation, Hitachi High-Technologies, Applied Materials, Onto Innovation, ASML, SCREEN Semiconductor Solutions, Lasertec, Camtek, ZEISS, Toray Engineering, Unity Semiconductor SAS, Microtronic, RSIC, Muetec and DJEL.

Key Developments:

In December 2023, Applied Materials, Inc. and CEA-Leti announced an expansion of their longstanding collaboration to focus on developing differentiated materials engineering solutions for several specialty semiconductor applications.

In July 2023, Applied Materials, Inc. introduced Vistara™, Applied's most significant wafer manufacturing platform innovation in more than a decade, designed to provide chipmakers with the flexibility, intelligence and sustainability needed to tackle growing chipmaking challenges.

In December 2022, KLA Corporation announced the launch of the revolutionary Axion® T2000 X-ray metrology system for advanced memory chip manufacturers. The Axion T2000 is a CD-SAXS (critical-dimension small angle X-ray scattering) system, leveraging industry-unique X-ray technologies to produce high-resolution measurements of critical dimensions and 3D shapes of memory device features.

Types Covered:

  • Metrology Equipment
  • Defect Inspection Equipment

Functions Covered:

  • Automated Inspection Systems
  • Manual Inspection Systems
  • Software Solutions

Technologies Covered:

  • Optical Inspection
  • Scanning Probe Microscopy
  • Electron Beam Inspection
  • Other Technologies

Applications Covered:

  • Mask/Film
  • Wafer
  • Process Control and Optimization
  • Research and Development
  • Other Applications

Regions Covered:

  • North America
    • US
    • Canada
    • Mexico
  • Europe
    • Germany
    • UK
    • Italy
    • France
    • Spain
    • Rest of Europe
  • Asia Pacific
    • Japan
    • China
    • India
    • Australia
    • New Zealand
    • South Korea
    • Rest of Asia Pacific
  • South America
    • Argentina
    • Brazil
    • Chile
    • Rest of South America
  • Middle East & Africa
    • Saudi Arabia
    • UAE
    • Qatar
    • South Africa
    • Rest of Middle East & Africa

What our report offers:

  • Market share assessments for the regional and country-level segments
  • Strategic recommendations for the new entrants
  • Covers Market data for the years 2021, 2022, 2023, 2026, and 2030
  • Market Trends (Drivers, Constraints, Opportunities, Threats, Challenges, Investment Opportunities, and recommendations)
  • Strategic recommendations in key business segments based on the market estimations
  • Competitive landscaping mapping the key common trends
  • Company profiling with detailed strategies, financials, and recent developments
  • Supply chain trends mapping the latest technological advancements

Free Customization Offerings:

All the customers of this report will be entitled to receive one of the following free customization options:

  • Company Profiling
    • Comprehensive profiling of additional market players (up to 3)
    • SWOT Analysis of key players (up to 3)
  • Regional Segmentation
    • Market estimations, Forecasts and CAGR of any prominent country as per the client's interest (Note: Depends on feasibility check)
  • Competitive Benchmarking
    • Benchmarking of key players based on product portfolio, geographical presence, and strategic alliances

Table of Contents

1 Executive Summary

2 Preface

  • 2.1 Abstract
  • 2.2 Stake Holders
  • 2.3 Research Scope
  • 2.4 Research Methodology
    • 2.4.1 Data Mining
    • 2.4.2 Data Analysis
    • 2.4.3 Data Validation
    • 2.4.4 Research Approach
  • 2.5 Research Sources
    • 2.5.1 Primary Research Sources
    • 2.5.2 Secondary Research Sources
    • 2.5.3 Assumptions

3 Market Trend Analysis

  • 3.1 Introduction
  • 3.2 Drivers
  • 3.3 Restraints
  • 3.4 Opportunities
  • 3.5 Threats
  • 3.6 Technology Analysis
  • 3.7 Application Analysis
  • 3.8 Emerging Markets
  • 3.9 Impact of Covid-19

4 Porters Five Force Analysis

  • 4.1 Bargaining power of suppliers
  • 4.2 Bargaining power of buyers
  • 4.3 Threat of substitutes
  • 4.4 Threat of new entrants
  • 4.5 Competitive rivalry

5 Global Semiconductor Inspection and Measurement Equipment Market, By Type

  • 5.1 Introduction
  • 5.2 Metrology Equipment
  • 5.3 Defect Inspection Equipment

6 Global Semiconductor Inspection and Measurement Equipment Market, By Function

  • 6.1 Introduction
  • 6.2 Automated Inspection Systems
  • 6.3 Manual Inspection Systems
  • 6.4 Software Solutions

7 Global Semiconductor Inspection and Measurement Equipment Market, By Technology

  • 7.1 Introduction
  • 7.2 Optical Inspection
  • 7.3 Scanning Probe Microscopy
  • 7.4 Electron Beam Inspection
  • 7.5 Other Technologies

8 Global Semiconductor Inspection and Measurement Equipment Market, By Application

  • 8.1 Introduction
  • 8.2 Mask/Film
  • 8.3 Wafer
  • 8.4 Process Control and Optimization
  • 8.5 Research and Development
  • 8.6 Other Applications

9 Global Semiconductor Inspection and Measurement Equipment Market, By Geography

  • 9.1 Introduction
  • 9.2 North America
    • 9.2.1 US
    • 9.2.2 Canada
    • 9.2.3 Mexico
  • 9.3 Europe
    • 9.3.1 Germany
    • 9.3.2 UK
    • 9.3.3 Italy
    • 9.3.4 France
    • 9.3.5 Spain
    • 9.3.6 Rest of Europe
  • 9.4 Asia Pacific
    • 9.4.1 Japan
    • 9.4.2 China
    • 9.4.3 India
    • 9.4.4 Australia
    • 9.4.5 New Zealand
    • 9.4.6 South Korea
    • 9.4.7 Rest of Asia Pacific
  • 9.5 South America
    • 9.5.1 Argentina
    • 9.5.2 Brazil
    • 9.5.3 Chile
    • 9.5.4 Rest of South America
  • 9.6 Middle East & Africa
    • 9.6.1 Saudi Arabia
    • 9.6.2 UAE
    • 9.6.3 Qatar
    • 9.6.4 South Africa
    • 9.6.5 Rest of Middle East & Africa

10 Key Developments

  • 10.1 Agreements, Partnerships, Collaborations and Joint Ventures
  • 10.2 Acquisitions & Mergers
  • 10.3 New Product Launch
  • 10.4 Expansions
  • 10.5 Other Key Strategies

11 Company Profiling

  • 11.1 KLA Corporation
  • 11.2 Hitachi High-Technologies
  • 11.3 Applied Materials
  • 11.4 Onto Innovation
  • 11.5 ASML
  • 11.6 SCREEN Semiconductor Solutions
  • 11.7 Lasertec
  • 11.8 Camtek
  • 11.9 ZEISS
  • 11.10 Toray Engineering
  • 11.11 Unity Semiconductor SAS
  • 11.12 Microtronic
  • 11.13 RSIC
  • 11.14 Muetec
  • 11.15 DJEL
ºñ±³¸®½ºÆ®
0 °ÇÀÇ »óǰÀ» ¼±Åà Áß
»óǰ ºñ±³Çϱâ
Àüü»èÁ¦